文档预览： Figure 1: 4-bit Up/Down Counter + BCD circuit. Up/Down Counter COUNT UPDN VALUE 4 Value-to-BCD TENS 4 ONES 4 CLK RST Lab 4: 4-bit Up/Down Counter In this lab you will build a 4-bit counter that can count up, count down, or remain at ... 点击下载

文档预览： TestbenchDesignHWSWPartitioningSystem ModelDesign AnalysisOptimization...Price performance falls rapidly as n increases for all but tiny values of ... 点击下载

文档预览： Scicos-HDL User Guide 1About Scicos-HDL 1.1 Features Links The Scilab/Scicos with the Digital circuit design (EDA) . Integrates the hardware circuit, algorithm and Scilab/Scicos environment as a plat for digital circuit design, simulation and ... 点击下载

文档预览： Aims of the Conference: ASP-DAC 2012 is the seventeenth annual international conference on VLSI design automation in Asia and South Pacific region, one of the most active regions of design and fabrication of silicon chips in the world. The ... 点击下载

文档预览： All XC-prefix product designations are trademarks of XILINX.Xilinx ISE 10 ...Download and Test XSA BoardXilinx ISE 10 Tutorial4 XESS Corporation - www.... 点击下载

文档预览： 172 SystemVerilog Assertions Handbook 1. SCOPE 1.1 Scope This document establishes the requirements for an Intellectual Property (IP) that provides a synchronous First-In First-Out (FIFO) function. The specification is primarily targeted ... 点击下载

文档预览： 2 Abstract The objective of this project is to create a laboratory scale magnetic levitating train model using Inductrack technology developed by Dr. Richard Post from Lawrence Livermore National Labs, Previous work by Paul Friend is discussed as ... 点击下载

文档预览： ii Copyright Notice and Proprietary Information Copyright 2003 Synopsys, Inc. All rights reserved. This software and documentation contain confidential and proprietary information that is the property of Synopsys, Inc. The software and documentation ... 点击下载

文档预览： First, the integer subtract instruction is sufficient to exercise all of the... instruction source that mimics the instruction fetch stage provides test ... 点击下载

文档预览： State Machine Independent erasable test row Most I/Os Full control* of all pads Configurable BIST DC Scan logic > 98% Massively parallel test enabler... 点击下载